Near-field microscopy of evanescent microwaves

Local control of evanescent microwaves is experimentally investigated using a scanning near-field microwave microscope. The capabilitiesof the microscope and the contribution, on the near field images, of propagating field components stemming from inelastic (out-of-plane)scattering were elucidated....

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Detaylı Bibliyografya
Yayımlandı:Revista Mexicana de Física
Asıl Yazarlar: V. Coello, R. Villagómez, R. Cortés, R. López, C. Martínez
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Sociedad Mexicana de Física A.C. 2005
Konular:
Física, Astronomía y Matemáticas
wave optics
Scanning near
microwave radiation
field optical microscopy
Online Erişim:https://www.redalyc.org/articulo.oa?id=57064013
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