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Application of the total internal reflection phenomenon as a gas sensing technique using evaporated SnO2 thin films

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Bibliographic Details
Published in:Revista Mexicana de Física
Main Authors: L. Martínez, V. Altuzar, V. Garibay, M. Lozada, N. Muñoz, M. Aguilar, O. Zelaya
Format: Artigo
Language:Inglês
Published: Sociedad Mexicana de Física A.C. 2004
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Online Access:https://www.redalyc.org/articulo.oa?id=57050515
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