Interface description using computational methods and tribological characteristic OF TiN/TiC films prepared by reactive pulse arc evaporation technique
The TiN/TiC bilayers have been deposited by Plasma Assisted Physical Vapor Deposition Technique (PAPVD) - Reactive Pulsed Arc. The coatings were analyzed by X-Ray Photoelectron Spectroscopy (XPS) and X-Ray Diffraction (XRD). From the signal treatment of the narrow XPS spectra and the XRD diffraction...
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| Publicat a: | Revista Mexicana de Física |
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| Autors principals: | , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Sociedad Mexicana de Física A.C.
2013
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| Matèries: | |
| Accés en línia: | https://www.redalyc.org/articulo.oa?id=57030970015 |
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