Nalaganje...

XPS STRUCTURE ANALYSIS OF TiN/TiC BILAYERS PRODUCED BY PULSED VACUUM ARC DISCHARGE

TiN/TiC Bilayers were grown on 304 stainless steel substrates using physical vapour deposition assisted by pulsed arc plasma system (PAPVD) at two substrate temperatures (50º C and 150º C). X ray photoelectron spectroscopy (XPS) was used to analyze the chemical composition by observing the behaviou...

Popoln opis

Shranjeno v:
Bibliografske podrobnosti
izdano v:Dyna
Main Authors: ELISABETH RESTREPO PARRA, PEDRO JOSE ARANGO ARANGO, VICENTE JAVIER BENAVIDES PALACIO
Format: Artigo
Jezik:Inglês
Izdano: Universidad Nacional de Colombia 2010
Teme:
XPS
Online dostop:https://www.redalyc.org/articulo.oa?id=49615099008
Oznake: Označite
Brez oznak, prvi označite!