XPS STRUCTURE ANALYSIS OF TiN/TiC BILAYERS PRODUCED BY PULSED VACUUM ARC DISCHARGE

TiN/TiC Bilayers were grown on 304 stainless steel substrates using physical vapour deposition assisted by pulsed arc plasma system (PAPVD) at two substrate temperatures (50º C and 150º C). X ray photoelectron spectroscopy (XPS) was used to analyze the chemical composition by observing the behaviou...

Cur síos iomlán

Na minha lista:
Sonraí Bibleagrafaíochta
Foilsithe in:Dyna
Main Authors: ELISABETH RESTREPO PARRA, PEDRO JOSE ARANGO ARANGO, VICENTE JAVIER BENAVIDES PALACIO
Formáid: Artigo
Teanga:Inglês
Foilsithe: Universidad Nacional de Colombia 2010
Ábhair:
Ingeniería
XPS
PAPVD
stoichiometry
depth profiles
chemical composition
Rochtain Ar Líne:https://www.redalyc.org/articulo.oa?id=49615099008
Clibeanna: Cuir Clib Leis
Gan Chlibeanna, Bí ar an gcéad duine leis an taifead seo a chlibeáil!

Míreanna Comhchosúla