Microstructure investigation of annealed thin films with texture using the extinction phenomenon

Παρόμοια τεκμήρια

• Microstructure investigation of annealed thin films with texture using the extinction phenomenon
  από: T. Kryshtab, κ.ά.
  Έκδοση: (2009)
• A comparison of the effect of multiple scattering on first and second order X-ray diffraction from textured polycrystals, for the investigation of secondary extinction
  από: J. Palacios Gómez
  Έκδοση: (2016)
• La extinción primaria y el factor estático de Debye-Waller en la caracterización de níquel con textura mediante difracción de rayos X
  από: T. Kryshtab, κ.ά.
  Έκδοση: (2015)
• Contributions to the defocusing effect on pole figure measurements by X-ray diffraction
  από: J. Palacios Gómez, κ.ά.
  Έκδοση: (2015)
• Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques
  από: John Deiver Bonilla-Jaimes, κ.ά.
  Έκδοση: (2016)