Microstructure investigation of annealed thin films with texture using the extinction phenomenon

समान संसाधन

• Microstructure investigation of annealed thin films with texture using the extinction phenomenon
  द्वारा: T. Kryshtab, और अन्य
  प्रकाशित: (2009)
• A comparison of the effect of multiple scattering on first and second order X-ray diffraction from textured polycrystals, for the investigation of secondary extinction
  द्वारा: J. Palacios Gómez
  प्रकाशित: (2016)
• La extinción primaria y el factor estático de Debye-Waller en la caracterización de níquel con textura mediante difracción de rayos X
  द्वारा: T. Kryshtab, और अन्य
  प्रकाशित: (2015)
• Contributions to the defocusing effect on pole figure measurements by X-ray diffraction
  द्वारा: J. Palacios Gómez, और अन्य
  प्रकाशित: (2015)
• Non-destructive in situ analysis of garnet by combining scanning electron microscopy and X-ray diffraction techniques
  द्वारा: John Deiver Bonilla-Jaimes, और अन्य
  प्रकाशित: (2016)