Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry
In this work, an optical setup that gives the possibility of using either ESPI or ESPSI has been implemented to assess in-plane strains induced on a composite sample. First, in-plane ESPI was used to measure displacement fields, which later allowed us to evaluate the corresponding strain fields. Nex...
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| Publicado en: | Revista Mexicana de Física |
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| Principais autores: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Sociedad Mexicana de Física A.C.
2011
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| Assuntos: | |
| Acceso en liña: | https://www.redalyc.org/articulo.oa?id=57021213008 |
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