Refractive index of multiline nanosecond laser-induced periodic surface structures and porous silicon
To study the effect of multiline laser processing in the optical response of silicon, a set of p-type single-crystalline silicon wafers with 0.01 to 0.02 m resistivity, 525 ¹m thickness, and [111] orientation, was irradiated with a multiline Nd:YAG pulsed laser (1064, 532 and 355 nm) applying energ...
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| Pubblicato in: | Revista Mexicana de Física |
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| Autori principali: | , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Sociedad Mexicana de Física A.C.
2011
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| Soggetti: | |
| Accesso online: | https://www.redalyc.org/articulo.oa?id=57021213002 |
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