Scaling Laws in PZT Thin Films Grown on Si(001) and Nb-Doped SrTiO3(001) Substrates

A dynamic scaling and kinetic roughening study was done on digitized atomic force microscope (AFM) imagesof Pb(Zr0:52;Ti0:48)O3 (PZT) thin films. The films were grown on Si(001) and Nb¡SrTiO3(001) (STNO)substrates via rf-sputtering technique at high oxygen pressures at substrate temperatures of 600...

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Publicat a:Brazilian Journal of Physics
Autors principals: W. Lopera, A. Cortes, J. G. Ramírez, M. E. Gómez, P. Prieto
Format: Artigo
Idioma:Inglês
Publicat: Sociedade Brasileira de Física 2006
Matèries:
Física, Astronomía y Matemáticas
PZT
AFM
Thin films
Scaling laws
Accés en línia:https://www.redalyc.org/articulo.oa?id=46436571
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