Loading...
Sample preparation method for scanning force microscopy
We present a method of sample preparation for studies of ion implantation on metal surfaces. The method, employing a mechanical mask, is specially adapted for samples analysed by Scanning Force Microscopy. It was successfully tested on polycrystallyne copper substrates implanted with phosphorus ions...
Na minha lista:
| Udgivet i: | Brazilian Journal of Physics |
|---|---|
| Main Authors: | , , , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Sociedade Brasileira de Física
2001
|
| Fag: | |
| Online adgang: | https://www.redalyc.org/articulo.oa?id=46413504005 |
| Tags: |
Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!
|