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Analysis of Distortion Based on 2D MEMS Micromirror Scanning Projection System

To analyze the distortion problem of two-dimensional micro-electromechanical system (MEMS) micromirror in-plane scanning, this paper makes a full theoretical analysis of the distortion causes from many aspects. Firstly, the mathematical relations among the deflection angle, laser incidence angle, an...

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Detalhes bibliográficos
Publicado no:Micromachines (Basel)
Main Authors: Wang, Xichen, Xie, Yingke, Liang, Hengheng, Zhong, Nianbing
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2021
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC8306571/
https://ncbi.nlm.nih.gov/pubmed/34357228
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/mi12070818
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