Correlating the electronic structures of metallic/semiconducting MoTe(2) interface to its atomic structures

Contact interface properties are important in determining the performances of devices that are based on atomically thin two-dimensional (2D) materials, especially for those with short channels. Understanding the contact interface is therefore important to design better devices. Herein, we use scanni...

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Dades bibliogràfiques
Publicat a:Natl Sci Rev
Autors principals: Han, Bo, Yang, Chen, Xu, Xiaolong, Li, Yuehui, Shi, Ruochen, Liu, Kaihui, Wang, Haicheng, Ye, Yu, Lu, Jing, Yu, Dapeng, Gao, Peng
Format: Artigo
Idioma:Inglês
Publicat: Oxford University Press 2020
Matèries:
Materials Science
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC8288393/
https://ncbi.nlm.nih.gov/pubmed/34691565
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/nsr/nwaa087
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