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Correlating the electronic structures of metallic/semiconducting MoTe(2) interface to its atomic structures
Contact interface properties are important in determining the performances of devices that are based on atomically thin two-dimensional (2D) materials, especially for those with short channels. Understanding the contact interface is therefore important to design better devices. Herein, we use scanni...
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | Natl Sci Rev |
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| Κύριοι συγγραφείς: | , , , , , , , , , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
Oxford University Press
2020
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| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8288393/ https://ncbi.nlm.nih.gov/pubmed/34691565 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/nsr/nwaa087 |
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