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Origin of light instability in amorphous IGZO thin-film transistors and its suppression
Radiating amorphous In–Ga–Zn–O (a-IGZO) thin-film transistors (TFTs) with deep ultraviolet light (λ = 175 nm) is found to induce rigid negative threshold-voltage shift, as well as a subthreshold hump and an increase in subthreshold-voltage slope. These changes are attributed to the photo creation an...
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| Veröffentlicht in: | Sci Rep |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Nature Publishing Group UK
2021
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8285384/ https://ncbi.nlm.nih.gov/pubmed/34272454 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-021-94078-8 |
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