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Electrical Interconnection and Bonding by Nano-Locking

The growing demand for increased chip performance and stable reliability calls for the development of novel off-chip interconnection and bonding methods that can process good electrical, thermal, and mechanical performance simultaneously as well as superior reliability. A chip bonding method with th...

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Detalhes bibliográficos
Publicado no:Nanomaterials (Basel)
Main Authors: Guo, Jielin, Shih, Yu-Chou, Shi, Frank G.
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2021
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC8233979/
https://ncbi.nlm.nih.gov/pubmed/34204330
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano11061589
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