Electrically Robust Single‐Crystalline WTe(2) Nanobelts for Nanoscale Electrical Interconnects

As the elements of integrated circuits are downsized to the nanoscale, the current Cu‐based interconnects are facing limitations due to increased resistivity and decreased current‐carrying capacity because of scaling. Here, the bottom‐up synthesis of single‐crystalline WTe(2) nanobelts and low‐ and...

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Dades bibliogràfiques
Publicat a:Adv Sci (Weinh)
Autors principals: Song, Seunguk, Kim, Se‐Yang, Kwak, Jinsung, Jo, Yongsu, Kim, Jung Hwa, Lee, Jong Hwa, Lee, Jae‐Ung, Kim, Jong Uk, Yun, Hyung Duk, Sim, Yeoseon, Wang, Jaewon, Lee, Do Hee, Seok, Shi‐Hyun, Kim, Tae‐il, Cheong, Hyeonsik, Lee, Zonghoon, Kwon, Soon‐Yong
Format: Artigo
Idioma:Inglês
Publicat: John Wiley and Sons Inc. 2018
Matèries:
Full Papers
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC6364501/
https://ncbi.nlm.nih.gov/pubmed/30775229
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/advs.201801370
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