Electrically Robust Single‐Crystalline WTe(2) Nanobelts for Nanoscale Electrical Interconnects

As the elements of integrated circuits are downsized to the nanoscale, the current Cu‐based interconnects are facing limitations due to increased resistivity and decreased current‐carrying capacity because of scaling. Here, the bottom‐up synthesis of single‐crystalline WTe(2) nanobelts and low‐ and...

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Detalhes bibliográficos
Publicado no:Adv Sci (Weinh)
Main Authors: Song, Seunguk, Kim, Se‐Yang, Kwak, Jinsung, Jo, Yongsu, Kim, Jung Hwa, Lee, Jong Hwa, Lee, Jae‐Ung, Kim, Jong Uk, Yun, Hyung Duk, Sim, Yeoseon, Wang, Jaewon, Lee, Do Hee, Seok, Shi‐Hyun, Kim, Tae‐il, Cheong, Hyeonsik, Lee, Zonghoon, Kwon, Soon‐Yong
Formato: Artigo
Idioma:Inglês
Publicado em: John Wiley and Sons Inc. 2018
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Full Papers
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6364501/
https://ncbi.nlm.nih.gov/pubmed/30775229
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/advs.201801370
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