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Local stiffness and work function variations of hexagonal boron nitride on Cu(111)
Combined scanning tunnelling and atomic force microscopy using a qPlus sensor enables the measurement of electronic and mechanic properties of two-dimensional materials at the nanoscale. In this work, we study hexagonal boron nitride (h-BN), an atomically thin 2D layer, that is van der Waals-coupled...
Tallennettuna:
| Julkaisussa: | Beilstein J Nanotechnol |
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| Päätekijät: | , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Beilstein-Institut
2021
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8218540/ https://ncbi.nlm.nih.gov/pubmed/34221802 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.12.46 |
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