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Novel Program Scheme of Vertical NAND Flash Memory for Reduction of Z-Interference

Minimizing the variation in threshold voltage (V(t)) of programmed cells is required to the extreme level for realizing multi-level-cells; as many as even 5 bits per cell recently. In this work, a recent program scheme to write the cells from the top, for instance the 170th layer, to the bottom, the...

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Detalhes bibliográficos
Publicado no:Micromachines (Basel)
Main Authors: Yi, Su-in, Kim, Jungsik
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2021
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC8160891/
https://ncbi.nlm.nih.gov/pubmed/34065435
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/mi12050584
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