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Exact statistical solution for the hopping transport of trapped charge via finite Markov jump processes
In this study, we developed a discrete theory of the charge transport in thin dielectric films by trapped electrons or holes, that is applicable both for the case of countable and a large number of traps. It was shown that Shockley–Read–Hall-like transport equations, which describe the 1D transport...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2021
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8119975/ https://ncbi.nlm.nih.gov/pubmed/33986313 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-021-89280-7 |
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