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Charge transport mechanism in dielectrics: drift and diffusion of trapped charge carriers

In this study, we developed a continuum theory of the charge transport in dielectrics by trapped electrons and holes, which takes into account two separate contributions of the current of trapped charge carriers: the drift part and the diffusion one. It was shown that drift current is mostly dominan...

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Detalles Bibliográficos
Publicado en:Sci Rep
Main Authors: Pil’nik, Andrey A., Chernov, Andrey A., Islamov, Damir R.
Formato: Artigo
Idioma:Inglês
Publicado: Nature Publishing Group UK 2020
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC7519148/
https://ncbi.nlm.nih.gov/pubmed/32978427
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-72615-1
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