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Optimized cryo-EM data-acquisition workflow by sample-thickness determination

Sample thickness is a known key parameter in cryo-electron microscopy (cryo-EM) and can affect the amount of high-resolution information retained in the image. Yet, common data-acquisition approaches in single-particle cryo-EM do not take it into account. Here, it is demonstrated how the sample thic...

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Bibliografske podrobnosti
izdano v:Acta Crystallogr D Struct Biol
Main Authors: Rheinberger, Jan, Oostergetel, Gert, Resch, Guenter P., Paulino, Cristina
Format: Artigo
Jezik:Inglês
Izdano: International Union of Crystallography 2021
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC8098475/
https://ncbi.nlm.nih.gov/pubmed/33950013
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S205979832100334X
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