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Optimized cryo-EM data-acquisition workflow by sample-thickness determination
Sample thickness is a known key parameter in cryo-electron microscopy (cryo-EM) and can affect the amount of high-resolution information retained in the image. Yet, common data-acquisition approaches in single-particle cryo-EM do not take it into account. Here, it is demonstrated how the sample thic...
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| Publicado no: | Acta Crystallogr D Struct Biol |
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| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2021
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8098475/ https://ncbi.nlm.nih.gov/pubmed/33950013 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S205979832100334X |
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