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A linear noise approximation for stochastic epidemic models fit to partially observed incidence counts

Stochastic epidemic models (SEMs) fit to incidence data are critical to elucidating outbreak dynamics, shaping response strategies, and preparing for future epidemics. SEMs typically represent counts of individuals in discrete infection states using Markov jump processes (MJPs), but are computationa...

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Detalles Bibliográficos
Publicado en:ArXiv
Main Authors: Fintzi, Jonathan, Wakefield, Jon, Minin, Vladimir N.
Formato: Artigo
Idioma:Inglês
Publicado: Cornell University 2021
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC8095205/
https://ncbi.nlm.nih.gov/pubmed/33948449
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