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Find Outliers of Image Edge Consistency by Weighted Local Linear Regression with Equality Constraints †

In this paper, we propose a general method to detect outliers from contaminated estimates of various image estimation applications. The method does not require any prior knowledge about the purpose, theory or hardware of the application but simply relies on the law of edge consistency between source...

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Podrobná bibliografie
Vydáno v:Sensors (Basel)
Hlavní autoři: Zhu, Mingzhu, Hu, Yaoqing, Yu, Junzhi, He, Bingwei, Liu, Jiantao
Médium: Artigo
Jazyk:Inglês
Vydáno: MDPI 2021
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC8038852/
https://ncbi.nlm.nih.gov/pubmed/33917476
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s21072563
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