Nalaganje...
Modelling Electron Channeling Contrast Intensity of Stacking Fault and Twin Boundary Using Crystal Thickness Effect
In a scanning electron microscope, the backscattered electron intensity modulations are at the origin of the contrast of like-Kikuchi bands and crystalline defects. The Electron Channeling Contrast Imaging (ECCI) technique is suited for defects characterization at a mesoscale with transmission elect...
Shranjeno v:
| izdano v: | Materials (Basel) |
|---|---|
| Main Authors: | , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
MDPI
2021
|
| Teme: | |
| Online dostop: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8036259/ https://ncbi.nlm.nih.gov/pubmed/33808289 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma14071696 |
| Oznake: |
Označite
Brez oznak, prvi označite!
|