טוען...
Modelling Electron Channeling Contrast Intensity of Stacking Fault and Twin Boundary Using Crystal Thickness Effect
In a scanning electron microscope, the backscattered electron intensity modulations are at the origin of the contrast of like-Kikuchi bands and crystalline defects. The Electron Channeling Contrast Imaging (ECCI) technique is suited for defects characterization at a mesoscale with transmission elect...
שמור ב:
| הוצא לאור ב: | Materials (Basel) |
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| Main Authors: | , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
MDPI
2021
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8036259/ https://ncbi.nlm.nih.gov/pubmed/33808289 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma14071696 |
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