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Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy
Reference samples are commonly used for the calibration and quantification of nanoscale electrical measurements of capacitances and dielectric constants in scanning microwave microscopy (SMM) and similar techniques. However, the traceability of these calibration samples is not established. In this w...
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| Pubblicato in: | Nanomaterials (Basel) |
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| Autori principali: | , , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
MDPI
2021
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8004899/ https://ncbi.nlm.nih.gov/pubmed/33806948 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano11030820 |
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