Piquemal, F., Morán-Meza, J., Delvallée, A., Richert, D., & Kaja, K. (2021). Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy. Nanomaterials (Basel).
Chicago Style CitationPiquemal, François, José Morán-Meza, Alexandra Delvallée, Damien Richert, and Khaled Kaja. "Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy." Nanomaterials (Basel) 2021.
MLA CitationPiquemal, François, et al. "Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy." Nanomaterials (Basel) 2021.
Warning: These citations may not always be 100% accurate.