Determination of wheat spike and spikelet architecture and grain traits using X-ray Computed Tomography imaging

BACKGROUND: Wheat spike architecture is a key determinant of multiple grain yield components and detailed examination of spike morphometric traits is beneficial to explain wheat grain yield and the effects of differing agronomy and genetics. However, quantification of spike morphometric traits has b...

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Vydáno v:Plant Methods
Hlavní autoři: Zhou, Hu, Riche, Andrew B., Hawkesford, Malcolm J., Whalley, William R., Atkinson, Brian S., Sturrock, Craig J., Mooney, Sacha J.
Médium: Artigo
Jazyk:Inglês
Vydáno: BioMed Central 2021
Témata:
Methodology
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC7945051/
https://ncbi.nlm.nih.gov/pubmed/33750418
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s13007-021-00726-5
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