Determination of wheat spike and spikelet architecture and grain traits using X-ray Computed Tomography imaging

BACKGROUND: Wheat spike architecture is a key determinant of multiple grain yield components and detailed examination of spike morphometric traits is beneficial to explain wheat grain yield and the effects of differing agronomy and genetics. However, quantification of spike morphometric traits has b...

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Detalhes bibliográficos
Publicado no:Plant Methods
Main Authors: Zhou, Hu, Riche, Andrew B., Hawkesford, Malcolm J., Whalley, William R., Atkinson, Brian S., Sturrock, Craig J., Mooney, Sacha J.
Formato: Artigo
Idioma:Inglês
Publicado em: BioMed Central 2021
Assuntos:
Methodology
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7945051/
https://ncbi.nlm.nih.gov/pubmed/33750418
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s13007-021-00726-5
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