Raman Spectroscopy-Based Quality Control of “Silicon-On-Insulator” Nanowire Chips for the Detection of Brain Cancer-Associated MicroRNA in Plasma

Application of micro-Raman spectroscopy for the monitoring of quality of nanowire sensor chips fabrication has been demonstrated. Nanowire chips have been fabricated on the basis of «silicon-on-insulator» (SOI) structures (SOI-NW chips). The fabrication of SOI-NW chips was performed by optical litog...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:Sensors (Basel)
Prif Awduron: Malsagova, Kristina A., Popov, Vladimir P., Kupriyanov, Igor N., Pleshakova, Tatyana O., Galiullin, Rafael A., Kozlov, Andrey F., Shumov, Ivan D., Larionov, Dmitry I., Tikhonenko, Fedor V., Kapustina, Svetlana I., Ziborov, Vadim S., Petrov, Oleg F., Gadzhieva, Olga A., Bashiryan, Boris A., Shimansky, Vadim N., Archakov, Alexander I., Ivanov, Yuri D.
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: MDPI 2021
Pynciau:
Article
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC7918486/
https://ncbi.nlm.nih.gov/pubmed/33668578
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s21041333
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