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Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head
A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest compone...
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| Vydáno v: | Sensors (Basel) |
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| Hlavní autoři: | , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI
2021
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7825750/ https://ncbi.nlm.nih.gov/pubmed/33430315 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s21020362 |
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