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Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy
This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applica...
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| Asıl Yazarlar: | , |
|---|---|
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
MDPI AG
2020-08-01
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| Seri Bilgileri: | Sensors |
| Konular: | |
| Online Erişim: | https://www.mdpi.com/1424-8220/20/17/4784 |
| Etiketler: |
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