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Focused Ion Beam Processing for 3D Chiral Photonics Nanostructures
The focused ion beam (FIB) is a powerful piece of technology which has enabled scientific and technological advances in the realization and study of micro- and nano-systems in many research areas, such as nanotechnology, material science, and the microelectronic industry. Recently, its applications...
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| 出版年: | Micromachines (Basel) |
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| 主要な著者: | , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI
2020
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7823276/ https://ncbi.nlm.nih.gov/pubmed/33374782 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/mi12010006 |
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