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Massively parallel cantilever-free atomic force microscopy
Resolution and field-of-view often represent a fundamental tradeoff in microscopy. Atomic force microscopy (AFM), in which a cantilevered probe deflects under the influence of local forces as it scans across a substrate, is a key example of this tradeoff with high resolution imaging being largely li...
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| Yayımlandı: | Nat Commun |
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| Asıl Yazarlar: | , , , , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Nature Publishing Group UK
2021
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| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7810748/ https://ncbi.nlm.nih.gov/pubmed/33452253 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-020-20612-3 |
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