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Generalized Heterodyne Configurations for Photo-induced Force Microscopy

Infrared chemical microscopy through mechanical probing of light-matter interactions by atomic force microscopy (AFM) bypasses the diffraction limit. One increasingly popular technique is photo-induced force microscopy (PiFM), which utilizes the mechanical heterodyne signal detection between cantile...

詳細記述

保存先:
書誌詳細
出版年:Anal Chem
主要な著者: Wang, Le, Jakob, Devon S., Wang, Haomin, Apostolos, Alexis, Pires, Marcos, Xu, Xiaoji G.
フォーマット: Artigo
言語:Inglês
出版事項: 2019
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC7798353/
https://ncbi.nlm.nih.gov/pubmed/31545025
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.analchem.9b03712
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