Nanoscale Ferroelectric Characterization with Heterodyne Megasonic Piezoresponse Force Microscopy

Piezoresponse force microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, intensive studies of conventional PFM have revealed a growing number of concerns and limitations which are lar...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Adv Sci (Weinh)
Egile Nagusiak: Zeng, Qibin, Wang, Hongli, Xiong, Zhuang, Huang, Qicheng, Lu, Wanheng, Sun, Kuan, Fan, Zhen, Zeng, Kaiyang
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: John Wiley and Sons Inc. 2021
Gaiak:
Full Papers
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC8061351/
https://ncbi.nlm.nih.gov/pubmed/33898182
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/advs.202003993
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