Surface and build‐up dose comparison between Elekta 6 MV flattening filter and flattening‐filter‐free beams using an advanced Markus ionization chamber and a solid water‐equivalent phantom

Using a plane‐parallel advanced Markus ionization chamber and a stack of water‐equivalent solid phantom blocks, percentage surface and build‐up doses of Elekta 6 MV flattening filter (FF) and flattening‐filter‐free (FFF) beams were measured as a function of the phantom depth for field sizes ranging...

पूर्ण विवरण

में बचाया:
ग्रंथसूची विवरण
में प्रकाशित:J Appl Clin Med Phys
मुख्य लेखकों: Imae, Toshikazu, Takenaka, Shigeharu, Watanabe, Yuichi, Aoki, Atsushi, Matsuda, Kanako, Sasaki, Katsutake, Saegusa, Shigeki, Nawa, Kanabu, Nakagawa, Keiichi, Abe, Osamu
स्वरूप: Artigo
भाषा:Inglês
प्रकाशित: John Wiley and Sons Inc. 2020
विषय:
Technical Notes
ऑनलाइन पहुंच:https://ncbi.nlm.nih.gov/pmc/articles/PMC7769389/
https://ncbi.nlm.nih.gov/pubmed/33184970
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/acm2.13094
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