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Solid-State Dewetting Dynamics of Amorphous Ge Thin Films on Silicon Dioxide Substrates
We report on the dewetting process, in a high vacuum environment, of amorphous Ge thin films on SiO(2)/Si (001). A detailed insight of the dewetting is obtained by in situ reflection high-energy electron diffraction and ex situ scanning electron microscopy. These characterizations show that the amor...
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| Published in: | Nanomaterials (Basel) |
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| Main Authors: | , , , , , , , , , , |
| Format: | Artigo |
| Language: | Inglês |
| Published: |
MDPI
2020
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| Subjects: | |
| Online Access: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7766082/ https://ncbi.nlm.nih.gov/pubmed/33348747 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano10122542 |
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