Solid-State Dewetting Dynamics of Amorphous Ge Thin Films on Silicon Dioxide Substrates

We report on the dewetting process, in a high vacuum environment, of amorphous Ge thin films on SiO(2)/Si (001). A detailed insight of the dewetting is obtained by in situ reflection high-energy electron diffraction and ex situ scanning electron microscopy. These characterizations show that the amor...

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Vydáno v:Nanomaterials (Basel)
Hlavní autoři: Toliopoulos, Dimosthenis, Fedorov, Alexey, Bietti, Sergio, Bollani, Monica, Bonera, Emiliano, Ballabio, Andrea, Isella, Giovanni, Bouabdellaoui, Mohammed, Abbarchi, Marco, Tsukamoto, Shiro, Sanguinetti, Stefano
Médium: Artigo
Jazyk:Inglês
Vydáno: MDPI 2020
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On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC7766082/
https://ncbi.nlm.nih.gov/pubmed/33348747
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano10122542
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