Probing Charge Accumulation at SrMnO(3)/SrTiO(3) Heterointerfaces via Advanced Electron Microscopy and Spectroscopy

[Image: see text] The last three decades have seen a growing trend toward studying the interfacial phenomena in complex oxide heterostructures. Of particular concern is the charge distribution at interfaces, which is a crucial factor in controlling the interface transport behavior. However, the stud...

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Argitaratua izan da:ACS Nano
Egile Nagusiak: Wang, Hongguang, Srot, Vesna, Jiang, Xijie, Yi, Min, Wang, Yi, Boschker, Hans, Merkle, Rotraut, Stark, Robert W., Mannhart, Jochen, van Aken, Peter A.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: American Chemical Society 2020
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC7596774/
https://ncbi.nlm.nih.gov/pubmed/32910642
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsnano.0c01545
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