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Probing Charge Accumulation at SrMnO(3)/SrTiO(3) Heterointerfaces via Advanced Electron Microscopy and Spectroscopy
[Image: see text] The last three decades have seen a growing trend toward studying the interfacial phenomena in complex oxide heterostructures. Of particular concern is the charge distribution at interfaces, which is a crucial factor in controlling the interface transport behavior. However, the stud...
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| 出版年: | ACS Nano |
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| 主要な著者: | , , , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
American
Chemical Society
2020
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| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7596774/ https://ncbi.nlm.nih.gov/pubmed/32910642 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsnano.0c01545 |
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