Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy

Scanning transmission electron microscopy (STEM) allows to gain quantitative information on the atomic-scale structure and composition of materials, satisfying one of todays major needs in the development of novel nanoscale devices. The aim of this study is to quantify the impact of inelastic, i.e....

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Vydáno v:Sci Rep
Hlavní autoři: Beyer, Andreas, Krause, Florian F., Robert, Hoel L., Firoozabadi, Saleh, Grieb, Tim, Kükelhan, Pirmin, Heimes, Damien, Schowalter, Marco, Müller-Caspary, Knut, Rosenauer, Andreas, Volz, Kerstin
Médium: Artigo
Jazyk:Inglês
Vydáno: Nature Publishing Group UK 2020
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Article
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC7578809/
https://ncbi.nlm.nih.gov/pubmed/33087734
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-74434-w
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