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Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy
Scanning transmission electron microscopy (STEM) allows to gain quantitative information on the atomic-scale structure and composition of materials, satisfying one of todays major needs in the development of novel nanoscale devices. The aim of this study is to quantify the impact of inelastic, i.e....
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7578809/ https://ncbi.nlm.nih.gov/pubmed/33087734 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-74434-w |
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