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X-ray characterization of contact holes for block copolymer lithography

The directed self-assembly (DSA) of block copolymers (BCPs) is a promising low-cost approach to patterning structures with critical dimensions (CDs) which are smaller than can be achieved by traditional photolithography. The CD of contact holes can be reduced by assembling a cylindrical BCP inside a...

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Detalhes bibliográficos
Publicado no:J Appl Crystallogr
Main Authors: Sunday, Daniel F., Delachat, Florian, Gharbi, Ahmed, Freychet, Guillaume, Liman, Christopher D., Tiron, Raluca, Kline, R. Joseph
Formato: Artigo
Idioma:Inglês
Publicado em: 2019
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7539622/
https://ncbi.nlm.nih.gov/pubmed/33033414
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