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Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE
In this paper, a novel method with cross-wavelet singular entropy (XWSE)-based feature extractor and support vector machine (SVM) is proposed for analog circuit fault diagnosis. Primarily, cross-wavelet transform (XWT), which possesses a good capability to restrain the environment noise, is applied...
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| Published in: | Entropy (Basel) |
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| Main Authors: | , , , |
| Format: | Artigo |
| Language: | Inglês |
| Published: |
MDPI
2018
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| Subjects: | |
| Online Access: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7513130/ https://ncbi.nlm.nih.gov/pubmed/33265693 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/e20080604 |
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