Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm

The parametric fault diagnosis of analog circuits is very crucial for condition-based maintenance (CBM) in prognosis and health management. In order to improve the diagnostic rate of parametric faults in engineering applications, a semi-supervised machine learning algorithm was used to classify the...

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Main Authors: Ling Wang, Dongfang Zhou, Hui Tian, Hao Zhang, Wei Zhang
Formato: Artigo
Idioma:Inglês
Publicado: MDPI AG 2019-02-01
Series:Symmetry
Assuntos:
fault diagnosis
lifting wavelet
local preserving projection
Fisher linear discriminant analysis
semi-supervised random forest
Acceso en liña:https://www.mdpi.com/2073-8994/11/2/228
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