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A new parafocusing paradigm for X-ray diffraction
A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the...
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| Publicat a: | J Appl Crystallogr |
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| Autors principals: | , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7401784/ https://ncbi.nlm.nih.gov/pubmed/32788904 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720008651 |
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