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A new parafocusing paradigm for X-ray diffraction
A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the...
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| Veröffentlicht in: | J Appl Crystallogr |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
International Union of Crystallography
2020
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7401784/ https://ncbi.nlm.nih.gov/pubmed/32788904 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720008651 |
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