ロード中...
A new parafocusing paradigm for X-ray diffraction
A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the...
保存先:
| 出版年: | J Appl Crystallogr |
|---|---|
| 主要な著者: | , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
International Union of Crystallography
2020
|
| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7401784/ https://ncbi.nlm.nih.gov/pubmed/32788904 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720008651 |
| タグ: |
タグ追加
タグなし, このレコードへの初めてのタグを付けませんか!
|