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The Lattice Spacing Variability of Intrinsic Float-Zone Silicon
Precision lattice spacing comparison measurements at the National Institute of Standards and Technology (NIST) provide traceability of X-ray wavelength and powder diffraction standards to the international system of units (SI). Here, we both summarize and document key measurements from the last two...
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| Опубликовано в: : | J Res Natl Inst Stand Technol |
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| Главные авторы: | , , , , , , |
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2017
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| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7339534/ https://ncbi.nlm.nih.gov/pubmed/34877081 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.122.024 |
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