The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

Precision lattice spacing comparison measurements at the National Institute of Standards and Technology (NIST) provide traceability of X-ray wavelength and powder diffraction standards to the international system of units (SI). Here, we both summarize and document key measurements from the last two...

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Bibliografske podrobnosti
izdano v:J Res Natl Inst Stand Technol
Main Authors: Kessler, Ernest G., Szabo, Csilla I., Cline, James P., Henins, Albert, Hudson, Lawrence T., Mendenhall, Marcus H., Vaudin, Mark D.
Format: Artigo
Jezik:Inglês
Izdano: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 2017
Teme:
Article
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC7339534/
https://ncbi.nlm.nih.gov/pubmed/34877081
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.122.024
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