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Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging offers non-perturbative, molecular contrast for nanoscale characterization. The need to mitigate measurement artifacts and enhance sensitivity, however, requires narrowly-defined and strict sample preparation protocols. This limits reli...
שמור ב:
| הוצא לאור ב: | Nat Commun |
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| Main Authors: | , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Nature Publishing Group UK
2020
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7320136/ https://ncbi.nlm.nih.gov/pubmed/32591515 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-020-17043-5 |
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